IEC 61300-2-14 pdf – Fibre optic interconnecting devices and passive components – Basic test and measurement procedures – Part 2-14: Tests – High optical power
To minimize test equipment, the DUTs may be connected in series. Clause A.2 describes anexample of the test set-up for series-connected DUTs.
5Procedure
5.1Preconditioning
The chosen test samples shall be representative of a standard product.
Prepare and clean the DUTs according to the manufacturer’s instructions. Visual examination
shall be undertaken in accordance with EC 61300-3-1 and IEC 61300-3-35. Debris or thepresence of contamination is one of the primary causes of failure in high optical powerconnector applications.
NOTE IEC TR 62627-01 describes fibre optic connector cleaning methods.
Precondition the DUTs for 2 h or more at the standard atmospheric conditions as defined inIEC 61300-1,unless otherwise specified in the relevant specification.
5.2Initial examinations and measurements
Perform initial examinations and measurements on the DUTs as required by the relevantspecification. The results of the initial measurements shall be within the limits established inthe relevant specification.
5.3Conditioning
a) Set the chamber and the DUT to the standard atmospheric conditions. Place the DUT in the
chamber in its normal operating position. The hook-ups of the DUT to the peripheralequipment shall also be placed in their normal operating position, where required.
b) Set the chamber temperature and humidity to the specified severities (see 6.4 and 6.5).The
rate of change of temperature shall not exceed 1 C/min, averaged over a maximum periodof 5 min. Allow the DUT to reach the set stable temperature and maintain the temperature
for the exposure time.
c) Set the wavelength and optical power to be input to the DUT and turn on the optical source
and input optical power to the DUT.
d)Continue to input the optical power to the DUT for the exposure time specified (see 6.6).
Monitor the changes in attenuation and return loss of the DUT according to lEC 61300-3-3
during the exposure time. The changes shall be within the pass criteria specified in therelevant specification (see Annexe B).
NOTEOptical power absorption within the DUT can cause its internal temperature to rise leading to a changein attenuation. The duration of changing attenuation depends on the absorption rate and the thermal capacity ofthe DUT.Examples of the high power test results are described in lEC TR 62627-03-02 and lEC TR 62627-03-03.
e) At the completion of the exposure time，stop inputting the optical power and change the
temperature in the chamber to the standard atmospheric condition. Continue to maintain the
DUT in the chamber while the temperature is gradually changed.
5.4Recovery
Allow the DUT to remain under the standard atmospheric condition for 2 h or more, as definedin lEC 61300-1, unless otherwise specified in the relevant specification.
5.5Final examinations and measurements
On completion of the test, remove all fixtures and make final examinations and measurements
on the DUT, as required by the relevant specification，to ensure that there is no permanentdamage to the DuT. Clean the DUT accordingto the manufacturer’s instructions. The resultsof the final measurement shall be within the limit established in the relevant specification.
Unless otherwise specified in the relevant specification，visually examine the DUT inaccordance with IEC 61300-3-1. Check for evidence of any degradation in the DUT. Theseinclude, for example:
a) broken, loose or damaged parts or accessories;
b) breaking or damage to the cable jacket, seals, strain relief or fibres;c) displaced,bent, or broken parts.
6 Severity
6.1General
Severity is a combination of an optical power,a wavelength, a temperature,humidity and anexposure time.The severity shall be specified in the relevant specification.
NOTE IEC TR 62627-03-04 gives guidelines for high optical power testing.
6.2Optical power
The optical power of the test shall be decided in consideration of the application，unlessotherwise stated in the relevant specification.The recommended power levels for testing are:
10 mw, 30 mW, 50 mW,100 mw,300 mW and 500 mw.
6.3Wavelengths
The test wavelength shall be the centre or typical wavelength of all operating wavelength rangesspecified in the relevant specification. The recommended wavelengths for testing are;
980 nm,1 310 nm,1 490 nm,1510 nm,1 550 nm，1 580 nm,1610 nm,1625 nm and1 650 nm.
For WDM devices, the combinations of mult-wavelengths which are input at the same time shall
be decided in consideration of the application，unless otherwise stated in the relevantspecification.
6.4Temperature
Unless otherwise stated in the relevant specification, the test temperature shall be the maximumtemperature of the operating temperature range specified in the relevant specification.